Determination of the Thickness of Coated Thin Films Using Profilometry
Author
Kito, C. T., Ahemen, I, Amah, A. N and Gesa, F. N
Abstract
The measurement of thin film thickness is vital in various industrial and research applications, where coating precision impacts performance, durability, and functionality. Profilometry, a widely used surface characterization technique, which provides a reliable and accurate method for determining the thickness of coated films. This work highlights the principle, methodology, and significance of profilometry in film thickness measurement, with emphasis on contact method. The work was carried out using contact profilometry with CdO coated glass substrates. The result for both single and double dip coating shows smooth surfaces for all the deposited films. The extracted film thickness from the profilometry result for both single and double dip CdO coatings indicate an increase in film thickness with increasing dip/withdrawal speeds. This work encourages the advancement and dissemination of knowledge in thin films technology by fostering research collaborations in academic and research institutions, thus contributing to the growth of this critical area in materials science.
Keywords
Thickness, Coated Thin Films, Profilometry
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References
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